Enabling open-source trace tooling on NXP S32K344
Ian Baak (Student)
Testing machine learning applications
Petra Heck (Lid Lectoraat)
How to visualize a digital twin, based upon data derived from 20-sim?
Gunnink, B (Bas) (Student)
The Ampelmann DDT
Devin van Tuijll (Student); S.D. de Jong; T.J. Koreneef